发明名称 SEMICONDUCTOR MEMORY DEVICE PROVIDED WITH OVERDRIVING STRUCTURE, ESPECIALLY REDUCING MANUFACTURE TIME AND MANUFACTURE COST
摘要 PURPOSE: A semiconductor memory device provided with an overdriving structure is provided to reduce the manufacture time and the manufacture cost by not requiring the amendment repeated at the additional test process or the metal layer. CONSTITUTION: A semiconductor memory device provided with an overdriving structure includes a first power supply source, a first driving unit, a second driving unit and a control unit(40). The first power supply source supplies the normal voltage. The first driving unit drives the power line of the bit line sense amplifier as a voltage applied to the first power supply source and the connection node. The second driving unit drives the connection node as a voltage higher than the normal voltage. And, the control unit controls the second driving unit by detecting the voltage level state of the connection node for the set reference voltage.
申请公布号 KR20050009012(A) 申请公布日期 2005.01.24
申请号 KR20030048253 申请日期 2003.07.15
申请人 HYNIX SEMICONDUCTOR INC. 发明人 BAE, SEUNG CHEOL
分类号 G11C7/00;G11C7/06;G11C11/4074;G11C11/4091;G11C17/00;(IPC1-7):G11C11/409 主分类号 G11C7/00
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