CARRIER MODULE OF SEMICONDUCTOR TEST HANDLER FOR REDUCING EXCHANGE PERIOD BY EXCHANGING ONLY DEVICE LOADING SHUTTLE

摘要

PURPOSE: A carrier module of a semiconductor test handler is provided to exchange only a device loading shuttle according to a test target by forming the device loading shuttle with an individual independent of a carrier module body. CONSTITUTION: A carrier module body(210) is installed in a test tray. A device loading shuttle(220) is composed as an individual independent of the carrier module body. A semiconductor device is loaded on the device loading shuttle. A plurality of balls of the semiconductor device are exposed to the outside by through-holes formed at the device loading shuttle. An external unit fixes or releases the device loading shuttle to or from one side of the carrier module. An attaching/detaching unit attaches or detaches temporarily the device loading shuttle to or from one side of the carrier module body.