发明名称 |
SILOXANE-BASED RESIN CONTAINING GERMANIUM AND FABRICATING METHOD OF SEMICONDUCTOR INTERLAYER DIELECTRIC USING THE SAME FOR ADDING LOW DIELECTRIC PROPERTY TO INTERLAYER DIELECTRIC |
摘要 |
<p>PURPOSE: A siloxane-based resin containing germanium and a fabricating method of semiconductor interlayer dielectric using the same are provided to add a low dielectric property to the interlayer dielectric by using the siloxane-based resin including germanium having the low dielectric property. CONSTITUTION: A siloxane-based resin containing germanium is fabricated by a hydrolysis and condensation process using a monomer, an organic solvent, an acid catalyst or a basic catalyst, and water. An average molecular weight of the siloxane-based resin corresponds to a range of 3000 to 300000.</p> |
申请公布号 |
KR20050008048(A) |
申请公布日期 |
2005.01.21 |
申请号 |
KR20030047731 |
申请日期 |
2003.07.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, SANG KYUN;SEON, JONG BAEK |
分类号 |
C08G77/398;C08G77/50;C08G77/58;C09D183/14;H01L21/31;H01L21/312;H01L23/532;(IPC1-7):H01L21/31 |
主分类号 |
C08G77/398 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|