发明名称 SILOXANE-BASED RESIN CONTAINING GERMANIUM AND FABRICATING METHOD OF SEMICONDUCTOR INTERLAYER DIELECTRIC USING THE SAME FOR ADDING LOW DIELECTRIC PROPERTY TO INTERLAYER DIELECTRIC
摘要 <p>PURPOSE: A siloxane-based resin containing germanium and a fabricating method of semiconductor interlayer dielectric using the same are provided to add a low dielectric property to the interlayer dielectric by using the siloxane-based resin including germanium having the low dielectric property. CONSTITUTION: A siloxane-based resin containing germanium is fabricated by a hydrolysis and condensation process using a monomer, an organic solvent, an acid catalyst or a basic catalyst, and water. An average molecular weight of the siloxane-based resin corresponds to a range of 3000 to 300000.</p>
申请公布号 KR20050008048(A) 申请公布日期 2005.01.21
申请号 KR20030047731 申请日期 2003.07.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, SANG KYUN;SEON, JONG BAEK
分类号 C08G77/398;C08G77/50;C08G77/58;C09D183/14;H01L21/31;H01L21/312;H01L23/532;(IPC1-7):H01L21/31 主分类号 C08G77/398
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