发明名称 METHOD OF FORMING BIT LINE CONTACT OF SEMICONDUCTOR DEVICE FOR PREVENTING LOSS OF BIT LINE CONTACT
摘要 PURPOSE: A method of forming a bit line contact of a semiconductor device is provided to prevent the loss of the bit line contact by forming an insulating spacer on a lateral part of a bit line before a wet-cleaning process. CONSTITUTION: A semiconductor substrate(10) having a gate electrode(12) is provided. A first insulating layer(11) is formed on the substrate. A landing plug region is exposed by selectively etching the first insulating layer. A landing plug(13) is formed to bury the landing plug region. A second insulating layer(14) is formed on the entire surface of the substrate. Bit line contacts(15a,15b) for exposing a part of the landing plug are formed by etching the second insulating layer. Landing plugs(16a,16b) are formed on both sides of the bit line contact. A native oxide layer is removed from a bottom face of the bit line contact by the wet-cleaning process. The insulating spacer is removed therefrom.
申请公布号 KR20050008318(A) 申请公布日期 2005.01.21
申请号 KR20030048232 申请日期 2003.07.15
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, BAEK MANN
分类号 H01L21/283;(IPC1-7):H01L21/283 主分类号 H01L21/283
代理机构 代理人
主权项
地址