发明名称 DEVICE FOR THE POLARIZATION-SPECIFIC EXAMINATION OF AN OPTICAL SYSTEM
摘要 A device for polarization-specific examination of an optical system having a detector part that has polarization detector means for recording the exit state of polarization of radiation emerging from the optical system. Also, an associated optical imaging system, and a calibration method for the device. The device includes a polarization detector with a polarizing grating structure. Provided as an alternative is a device for snapshot polarimetry having a birefringent element and downstream polarizer element that adequately polarizes nonquasi-parallel radiation. The device may be used for determining the influence on the state of polarization of UV radiation by a microlithographic projection objective.
申请公布号 AU2003304304(A1) 申请公布日期 2005.01.21
申请号 AU20030304304 申请日期 2003.07.05
申请人 CARL ZEISS SMT AG 发明人 MARKUS MENGEL;ULRICH WEGMANN
分类号 G01J4/04;G01M11/00;G01M11/02;G01N21/21;G02B5/18;G02B5/30;G02B27/44;G03F7/20;H01L21/027;(IPC1-7):G03F7/20;G01J4/00 主分类号 G01J4/04
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