发明名称 |
METHOD OF FORMING ISOLATION LAYER OF SEMICONDUCTOR DEVICE USING OXYGEN IMPLANTATION PROCESS TO IMPLANT OXYGEN INTO ISOLATION REGION |
摘要 |
PURPOSE: A method of forming an isolation layer of a semiconductor device is provided to eliminate a process for burying an insulating material into a trench by implanting oxygen into an isolation region to form the isolation layer. CONSTITUTION: An ion implantation mask(103) is formed on a semiconductor substrate(101) in order to define an isolation region. An isolation layer formed with an oxide layer is deposited on the isolation region by implanting oxygen into the isolation region. A silicon layer is formed on a semiconductor substrate before the ion implantation mask is formed on the semiconductor substrate. The silicon layer is formed with an amorphous silicon layer.
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申请公布号 |
KR20050007985(A) |
申请公布日期 |
2005.01.21 |
申请号 |
KR20030047631 |
申请日期 |
2003.07.12 |
申请人 |
MAGNACHIP SEMICONDUCTOR, LTD. |
发明人 |
LEE, WON KWON |
分类号 |
H01L21/76;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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