发明名称 METHOD OF FORMING ISOLATION LAYER OF SEMICONDUCTOR DEVICE USING OXYGEN IMPLANTATION PROCESS TO IMPLANT OXYGEN INTO ISOLATION REGION
摘要 PURPOSE: A method of forming an isolation layer of a semiconductor device is provided to eliminate a process for burying an insulating material into a trench by implanting oxygen into an isolation region to form the isolation layer. CONSTITUTION: An ion implantation mask(103) is formed on a semiconductor substrate(101) in order to define an isolation region. An isolation layer formed with an oxide layer is deposited on the isolation region by implanting oxygen into the isolation region. A silicon layer is formed on a semiconductor substrate before the ion implantation mask is formed on the semiconductor substrate. The silicon layer is formed with an amorphous silicon layer.
申请公布号 KR20050007985(A) 申请公布日期 2005.01.21
申请号 KR20030047631 申请日期 2003.07.12
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 LEE, WON KWON
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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