发明名称 |
POLYCIDE GATE ELECTRODE WITH LOW RESISTIVITY USING METAL-RICH SILICIDE LAYER AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A polycide gate electrode and a method for manufacturing the same are provided to reduce resistivity and to improve reliability of a gate oxide layer by forming the polycide gate electrode using a metal-rich silicide layer instead of a silicon-rich silicide layer. CONSTITUTION: A gate oxide layer(32) is formed on a silicon substrate(31). A polysilicon layer(33) is formed on the gate oxide layer. A diffusion barrier layer(34) is formed on the polysilicon layer. A metal-rich tungsten silicide layer(35) is formed on the diffusion barrier layer. A hard mask(36) is formed on the metal-rich silicide layer. A polycide gate electrode is then formed by sequentially patterning the metal-rich silicide layer, the diffusion barrier layer and the polysilicon layer using the hard mask as a mask.
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申请公布号 |
KR20050007881(A) |
申请公布日期 |
2005.01.21 |
申请号 |
KR20030047502 |
申请日期 |
2003.07.12 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHA, TAE HO;CHO, HEUNG JAE;LIM, KWAN YONG |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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