发明名称 THIN FILM ELECTRODE FOR FORMING OHMIC CONTACT USING BINARY AND TERNARY ALLOY OR SOLID SOLUTION FOR FORMING P-TYPE THERMO-ELECTRONIC OXIDE THIN FILM FOR HIGH-QUALITY GaN-BASED OPTICAL DEVICE AND FABRICATING METHOD FOR BREAKING Mg-H BOND AND INCREASING DENSITY OF EFFECTIVE CARRIER AROUND GaN SURFACE
摘要 PURPOSE: A thin film electrode for forming an ohmic contact using a binary and ternary alloy or a solid solution for forming a p-type thermo-electronic oxide thin film for high-quality GaN-based optical device and a fabricating method thereof are provided to break a Mg-H bond and increase density of effective carrier around a GaN surface by using hydrogen affinity. CONSTITUTION: A first electrode layer(4) includes a Ni-based alloy or a solid solution to form a p-type thermo-electronic oxide thin film, which is laminated on p-type GaN(2). A second electrode layer(5) is laminated on the first electrode layer. The second electrode layer includes one or more element of Au, Pd, Pt, Ru, Re, Sc, Mg, Zn, V, Hf, Ta, Rh, Ir, W, Ti, Ag, Cr, Mo, Nb, Ca, Na, Sb, Li, In, Sn, Al, Ni, Cu, and Co.
申请公布号 KR20050007702(A) 申请公布日期 2005.01.21
申请号 KR20030047273 申请日期 2003.07.11
申请人 GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY;SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, SANG HO;LEEM, DONG SUK;SEONG, TAE YEON;SONG, JUNE O
分类号 H01L21/28;H01L21/285;H01L29/20;H01L29/45;H01L33/32;H01L33/42;(IPC1-7):H01L33/00 主分类号 H01L21/28
代理机构 代理人
主权项
地址