发明名称 |
METHOD OF FORMING CAPACITOR OF SEMICONDUCTOR DEVICE FOR INSULATING UPPER ELECTRODE AND LOWER ELECTRODE AND PREVENTING LEAKAGE CURRENT |
摘要 |
PURPOSE: A method of forming a capacitor of a semiconductor device is provided to insulate an upper electrode and a lower electrode and prevent leakage current by forming an insulator around the upper electrode. CONSTITUTION: An insulating layer is formed on a semiconductor substrate. A cylindrical photoresist pattern is formed by coating and patterning a photoresist on the insulating layer. A first insulating layer pattern having a center island is formed by dry-etching the insulating layer. A first metal layer(206) is formed within the first insulating layer pattern. A second insulating layer pattern(208) having a first trench is formed thereon. A third oxide layer pattern having a second trench is formed by etching the center island. A second metal layer, an insulator layer, and a third metal layer are sequentially formed thereon. A planarization process is performed on the resultant structure.
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申请公布号 |
KR20050008312(A) |
申请公布日期 |
2005.01.21 |
申请号 |
KR20030048226 |
申请日期 |
2003.07.15 |
申请人 |
MAGNACHIP SEMICONDUCTOR, LTD. |
发明人 |
LEE, JOON HYEON |
分类号 |
H01L27/04;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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