发明名称 SEMICONDUCTOR MEMORY DEVICE AND ITS MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor memory device having a planar type capacitor which can be increased in capacity value without increasing an occupation area, and also to provide its manufacturing method. <P>SOLUTION: In an n-type well of a p-type semiconductor substrate 1, a p-type diffusion layer 15 functioning as a storage node is so formed as to be connected to a p-type source region 8b. On top of the p-type diffusion layer 15, a plate electrode 5b is formed via a capacity insulation film 4b. On a side face of the plate electrode 5b, a plate section side wall 7b is formed. A capacity formation section contact plug 10b is formed through an interlayer insulation film 9 so that part of it may reach the source region 8b. Due to this structure, the capacity of the capacitor can be increased by a capacitor formed by the plate electrode 5b, the plate section side wall 7b, and the capacity formation section contact plug 10b. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005019598(A) 申请公布日期 2005.01.20
申请号 JP20030180836 申请日期 2003.06.25
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KOBAYASHI MUTSUMI
分类号 H01L21/8242;H01L27/108 主分类号 H01L21/8242
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