CIRCUIT FOR TESTING AND FINE TUNING INTEGRATED CIRCUIT (SWITCH CONTROL CIRCUIT)

摘要

A switch controlling circuit for the testing and fine-tuning of integrated circuits comprising of a series of flip-flops (30, 32, ..., 34) chained together in a serial manner. The contents of the flip-flop are shifted in from an input (38) leading to the first flip­flop (30) in the chain. The output of each flip-flop connects to individual transistor switch (F1, F2, ..., Fn) whereby the states of the flip-flops control the state of the switches. Circuitry (50, 52, ..., 54) for establishing a default state of the switches may be provided.