发明名称 THERMAL TREATMENT JIG AND THERMAL TREATMENT METHOD FOR WAFER
摘要 PROBLEM TO BE SOLVED: To provide a thermal treatment jig and a thermal treatment method capable of effectively suppressing occurenses of scratches or slips even if thermal treatment is carried out at high tmperatures of not less than 1,000°C. SOLUTION: The thermal treatment jig 1a which holds the wafer W when thermal treatment comprises at least a jig body 4a composed of hard material not defomed at the time of thermal treatment, and a holding part 2a with its at least surface 3a contacting with the wafer composed of a soft material softened more than the hard material when heat treating, preferably the same material as the wafer to be thermal treated, or the material with its hardness smaller than that of the wafer at the time of thermal treatment. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005019748(A) 申请公布日期 2005.01.20
申请号 JP20030183443 申请日期 2003.06.26
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 KOBAYASHI TAKESHI
分类号 H01L21/683;H01L21/22;H01L21/324;H01L21/68;(IPC1-7):H01L21/324 主分类号 H01L21/683
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