APPARATUS AND METHOD FOR GENERATING ADDRESS FOR SRAM BUILT-IN SELF TEST CIRCUIT USING ONE UP-COUNTER

摘要

PURPOSE: An apparatus and a method for generating an address for an SRAM(Static Random Access Memory) BIST(Built-In Self Test) circuit are provided to reduce size of the BIST circuit by using only one up-counter. CONSTITUTION: An apparatus for generating an address for a built-in self test circuit of a memory having addresses with the square of 2, and includes an up-counter(201), an inverter(203), and a selector(205). The up-counter(201) generates a first address(ADDR1) which is sequentially increased. The inverter(203) inverts the first address to generate a sequentially decreasing second address. The selector(205) selects either one of the first and second addresses in response to a control signal and outputs the selected result as the address to be tested.