发明名称 METHOD FOR VERIFYING PROXIMITY EFFECT CORRECTION AND VERIFICATION APPARATUS THEREFOR
摘要 <p><P>PROBLEM TO BE SOLVED: To produce an OPC (optical proximity correction) pattern of high accuracy in a short period of time by efficiently determining whether quantitative deviation in positions is caused by the logical fault of the OPC or not. <P>SOLUTION: A portion where the transfer accuracy is degraded is detected by comparing with a noncorrected simulation image. Specifically, the direction of the deviation of the OPC pattern with respect to the design pattern is compared with the direction of the deviation of the simulated transfer image of the design pattern with respect to the design pattern and the portion where the directions of the deviation coincide is determined as an error. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005017551(A) 申请公布日期 2005.01.20
申请号 JP20030180447 申请日期 2003.06.25
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 HINOGAMI REIKO;MITSUSAKA AKIO;TANIMOTO TADASHI;YAMAGIWA MINORU
分类号 G03F1/36;G03F1/68;H01L21/027;(IPC1-7):G03F1/08 主分类号 G03F1/36
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