发明名称 |
METHOD FOR PRODUCING SEMICONDUCTOR DEVICE UTILIZING ION IMPLANTATION |
摘要 |
A method for producing a transistor structure utilizing ion implantation, comprising the steps of implanting ions of base-forming impurity into a predetermined portion of a surface of a semiconductor body serving as a collector and heated to a temperature above 600 DEG C. but below the melting point of the semiconductor to form a base region, and thereafter implanting ions of emitter-forming impurity into a predetermined portion of the surface of said base region heated to a temperature in the range of 400 DEG to 600 DEG C. to form an emitter region.
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申请公布号 |
US3660171(A) |
申请公布日期 |
1972.05.02 |
申请号 |
USD3660171 |
申请日期 |
1969.12.24 |
申请人 |
HITACHI LTD. |
发明人 |
TAKASHI TSUCHIMOTO;TAKASHI TOKUYAMA;KIICHI KOMATSUBARA |
分类号 |
H01L21/00;H01L21/265;H01L29/00;(IPC1-7):H01L7/54 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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