发明名称 METHOD FOR PRODUCING SEMICONDUCTOR DEVICE UTILIZING ION IMPLANTATION
摘要 A method for producing a transistor structure utilizing ion implantation, comprising the steps of implanting ions of base-forming impurity into a predetermined portion of a surface of a semiconductor body serving as a collector and heated to a temperature above 600 DEG C. but below the melting point of the semiconductor to form a base region, and thereafter implanting ions of emitter-forming impurity into a predetermined portion of the surface of said base region heated to a temperature in the range of 400 DEG to 600 DEG C. to form an emitter region.
申请公布号 US3660171(A) 申请公布日期 1972.05.02
申请号 USD3660171 申请日期 1969.12.24
申请人 HITACHI LTD. 发明人 TAKASHI TSUCHIMOTO;TAKASHI TOKUYAMA;KIICHI KOMATSUBARA
分类号 H01L21/00;H01L21/265;H01L29/00;(IPC1-7):H01L7/54 主分类号 H01L21/00
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