发明名称 Dual loop sensing scheme for resistive memory elements
摘要 A method and apparatus for sensing a resistive state of a resistive memory element includes producing a first current related to a resistance of a memory cell. The first current is added to a second current during a first sensing time and subtracted from a third current during a second sensing time. The first, second and third currents are integrated over time using a capacitor, and a resulting voltage signal on the capacitor is timed using a clocked counter. A time average value of a digital output of the clocked counter is then related to the resistance of the memory cell, and hence to the resistive state of the resistive memory element.
申请公布号 US2005013184(A1) 申请公布日期 2005.01.20
申请号 US20040918453 申请日期 2004.08.16
申请人 BAKER R. JACOB 发明人 BAKER R. JACOB
分类号 G11C11/15;G11C7/06;G11C11/16;(IPC1-7):G11C7/00 主分类号 G11C11/15
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