| 摘要 |
PROBLEM TO BE SOLVED: To provide a high-reliability temperature decision circuit capable of detecting an abnormal temperature rise of an IC chip, if a part of the circuit is disabled, and a high-reliability IC chip temperature protector circuit which prevents an abnormal temperature rise of the IC chip, if a part of the circuit is disabled. SOLUTION: The temperature decision circuit structured to decide the temperature of an IC chip comprises a temperature detector circuit 152-1 for outputting the temperature of the IC chip as a detection voltage V-1, a temperature detector circuit 152-2 for outputting the temperature of the IC chip as a detection voltage V-2, a reference voltage generator circuit 151-1 for generating a reference voltage V+1, a reference voltage generator circuit 151-2 for generating a reference voltage V+2, a comparator circuit 153-1 for comparing the detection voltage V-1 with the reference voltage V+1 to output a voltage V01, and a comparator circuit 153-2 for comparing the detection voltage V-2 with the reference voltage V+2 to output a voltage V02. The temperature detector circuits 152-1, 152-2 have different characteristics. COPYRIGHT: (C)2005,JPO&NCIPI |
