Test system including an apparatus for conveying signals between a first circuit board and a second circuit board

摘要

A test system including an apparatus for conveying signals between a first circuit board and a second circuit board includes a dielectric substrate having a first side forming a first surface and a second side forming a second surface. The apparatus also includes a plurality of contact pins each configured to convey electrical signals. Each of the contact pins may extend through the dielectric substrate and may protrude beyond the first surface and the second surface. In addition, one or more of the contact pins may be formed using a pliable resistive material.