| 发明名称 |
Method and apparatus for testing an electronic device |
| 摘要 |
A method of testing an electronic device. A test pattern is transferred between a first data controller coupled to a first data interface and a second data controller coupled to a second data interface via an element coupling the first and second data interfaces. The test pattern is received and examined.
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| 申请公布号 |
US2005015213(A1) |
申请公布日期 |
2005.01.20 |
| 申请号 |
US20030619912 |
申请日期 |
2003.07.15 |
| 申请人 |
SOMERVILL KEVIN;CHAU ANDREW;DOBBS ROBERT WILLIAM |
发明人 |
SOMERVILL KEVIN;CHAU ANDREW;DOBBS ROBERT WILLIAM |
| 分类号 |
G01R31/3185;G06F11/267;(IPC1-7):G01R31/00 |
主分类号 |
G01R31/3185 |
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