发明名称 |
METHOD OF FORMING PATTERN |
摘要 |
PROBLEM TO BE SOLVED: To make excellent the shape of a resist pattern obtained by the immersion lithography. SOLUTION: After a resist film 101 composed of a chemically amplified resist material is formed, a resist film 102 is exposed to a pattern by selectively projecting exposing light 104 upon the film 102 in a state where a solution 103 containing a basic compound is supplied to the surface of the film 102. When the resist film 102 is developed with an alkaline developing solution after post-baking is performed on the resist film 102 exposed to the pattern, a resist pattern 106 composed of the unexposed sections 102b of the film 102 and having an excellent shape is obtained. COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2005019433(A) |
申请公布日期 |
2005.01.20 |
申请号 |
JP20030177889 |
申请日期 |
2003.06.23 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
ENDO MASATAKA;SASAKO MASARU |
分类号 |
G03F7/38;G03F7/00;G03F7/004;G03F7/038;G03F7/039;G03F7/20;H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
G03F7/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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