发明名称 METHOD OF FORMING PATTERN
摘要 PROBLEM TO BE SOLVED: To make excellent the shape of a resist pattern obtained by the immersion lithography. SOLUTION: After a resist film 101 composed of a chemically amplified resist material is formed, a resist film 102 is exposed to a pattern by selectively projecting exposing light 104 upon the film 102 in a state where a solution 103 containing a basic compound is supplied to the surface of the film 102. When the resist film 102 is developed with an alkaline developing solution after post-baking is performed on the resist film 102 exposed to the pattern, a resist pattern 106 composed of the unexposed sections 102b of the film 102 and having an excellent shape is obtained. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005019433(A) 申请公布日期 2005.01.20
申请号 JP20030177889 申请日期 2003.06.23
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 ENDO MASATAKA;SASAKO MASARU
分类号 G03F7/38;G03F7/00;G03F7/004;G03F7/038;G03F7/039;G03F7/20;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/38
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