发明名称 Plasma processing method and apparatus
摘要 The interior of a vacuum chamber is maintained at a specified pressure by introducing a specified gas into the vacuum chamber having a plasma trap provided therein. Simultaneously, therewith, evacuation of the chamber is performed by a pump as an evacuating device, and a high-frequency power of 100 MHz is supplied to a counter electrode by counter-electrode use high-frequency power supply. Thus, uniform plasma is generated within the vacuum chamber, where plasma processing such as etching, deposition, and surface reforming can be carried out uniformly with a substrate placed on a substrate electrode.
申请公布号 US2005011453(A1) 申请公布日期 2005.01.20
申请号 US20040920180 申请日期 2004.08.18
申请人 OKUMURA TOMOHIRO;HARAGUCHI HIDEO;MATSUI TAKUYA;MATSUDA IZURU;MITSUHASHI AKIO 发明人 OKUMURA TOMOHIRO;HARAGUCHI HIDEO;MATSUI TAKUYA;MATSUDA IZURU;MITSUHASHI AKIO
分类号 C23C16/505;H01J37/32;(IPC1-7):C23C16/00 主分类号 C23C16/505
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