发明名称 Precleaning method of precleaning a silicon nitride film forming system
摘要 A thermal processing system (1) includes a reaction vessel (2) capable of forming a silicon nitride film on semiconductor wafers (10) through interaction between hexachlorodisilane and ammonia, and an exhaust pipe (16) connected to the reaction vessel (2). The reaction vessel 2 is heated at a temperature in the range of 500 to 900° C. and the exhaust pipe (16) is heated at 100° C. before disassembling and cleaning the exhaust pipe 16. Ammonia is supplied through a process gas supply pipe (13) into the reaction vessel (2), and the ammonia is discharged from the reaction vessel (2) into the exhaust pipe (16).
申请公布号 US6844273(B2) 申请公布日期 2005.01.18
申请号 US20020066627 申请日期 2002.02.06
申请人 TOKYO ELECTRON LIMITED 发明人 KATO HITOSHI;FUKUSHIMA KOHEI;ENDO ATSUSHI;NISHITA TATSUO;KUMAGAI TAKESHI
分类号 C23C16/34;C23C16/44;H01L21/318;(IPC1-7):H01L21/31;H01L21/469 主分类号 C23C16/34
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