发明名称 Fabrication method of nitride-based semiconductors and nitride-based semiconductor fabricated thereby
摘要 The present invention relates to a fabrication method of nitride-based semiconductors and a nitride-based semiconductor fabricated thereby. In the fabrication method of the invention, a self-organizing metal layer is formed on a sapphire substrate. The sapphire substrate having the self-organizing metal layer is heated so that self-organizing metal coalesces into nanoscale clusters to irregularly expose an upper surface of the sapphire substrate. Exposed portions of the sapphire substrate is plasma etched using the self-organized metal clusters as a mask to form a nanoscale uneven structure on the sapphire substrate. A resultant structure is wet etched to remove the self-organized metal clusters. The nanoscale uneven structure formed on the sapphire substrate decreases the stress and resultant dislocation between the sapphire substrate and a nitride-based semiconductor layer as well as increases the quantum efficiency between the same.
申请公布号 US6844569(B1) 申请公布日期 2005.01.18
申请号 US20040831190 申请日期 2004.04.26
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 LEE KYU HAN;KIM SUN WOON;KIM JE WON
分类号 H01L21/3065;C30B29/60;H01L21/20;H01L21/205;H01L33/22;H01L33/32;(IPC1-7):H01L33/00 主分类号 H01L21/3065
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