发明名称 Method of manufacturing semiconductor device having storage electrode of capacitor
摘要 A method of manufacturing a semiconductor device having a storage electrode of a capacitor is provided. The method includes the steps of: forming a contact hole perforating through an interlayer dielectric layer on a semiconductor substrate; forming a conductive plug to fill the contact hole and expose the surface of the interlayer dielectric layer; forming molds on the interlayer dielectric layer to expose the surface of the conductive plug; recessing the upper surface of the conductive plug to expose a portion of the sidewalls of the interlayer dielectric layer; forming an electrode layer to cover the recessed conductive plug, and the sidewalls of the interlayer dielectric layer and the molds; and removing upper surfaces of the electrode layer to make a storage electrode until molds are exposed. The method further includes the steps of: forming a conductive pad electrically connected to the semiconductor substrate and a lower insulating layer surrounding the conductive pad; and forming bit line stacks on the lower insulating layer, wherein the interlayer dielectric layer covers the bit line stacks, and the contact hole between the bit line stacks exposes the conductive pad.
申请公布号 US6844229(B2) 申请公布日期 2005.01.18
申请号 US20010999150 申请日期 2001.10.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE MOON-HEE;SHIM WOO-GWAN;KO HYUNG-HO;CHUNG JONG-HO
分类号 H01L27/108;H01L21/02;H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L27/108
代理机构 代理人
主权项
地址
您可能感兴趣的专利