发明名称 Chemically amplified resist material and patterning method using same
摘要 A chemically amplified resist material comprising a base resin and a photo acid generator having sensitivity at the wavelength of patterning exposure; wherein, the chemically amplified resist material further comprising an activator that generates an acid or a radical by a treatment other than the patterning exposure. A patterning method using the same is also disclosed.
申请公布号 US6844135(B2) 申请公布日期 2005.01.18
申请号 US20030614236 申请日期 2003.07.08
申请人 FUJITSU LIMITED 发明人 KON JUNICHI;NOZAKI KOJI;YANO EI
分类号 G03F7/004;G03F7/038;G03F7/039;G03F7/38;H01L21/027;(IPC1-7):G03C1/73 主分类号 G03F7/004
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