发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING SINGLE DAMASCENE PROCESS
摘要 PURPOSE: A method of manufacturing a semiconductor device is provided to improve performance of the device by enhancing the structure of an MIM(Metal Insulator Metal) capacitor using a single damascene process. CONSTITUTION: A lower electrode(61a) and a lower metal line(61b) are formed on a semiconductor substrate(51). A first interlayer dielectric(63) is formed on the entire surface of the resultant structure. A first photoresist pattern for defining a capacitor region is formed thereon. A trench(65) for exposing the lower electrode to the outside is formed in the first interlayer dielectric by using the first photoresist pattern as an etching mask. A dielectric film(68) and an upper electrode(70) are completely filled in the trench.
申请公布号 KR20050005972(A) 申请公布日期 2005.01.15
申请号 KR20030045970 申请日期 2003.07.08
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 HAN, SEUNG HEE
分类号 H01L21/3205;(IPC1-7):H01L21/320 主分类号 H01L21/3205
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