发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING SINGLE DAMASCENE PROCESS |
摘要 |
PURPOSE: A method of manufacturing a semiconductor device is provided to improve performance of the device by enhancing the structure of an MIM(Metal Insulator Metal) capacitor using a single damascene process. CONSTITUTION: A lower electrode(61a) and a lower metal line(61b) are formed on a semiconductor substrate(51). A first interlayer dielectric(63) is formed on the entire surface of the resultant structure. A first photoresist pattern for defining a capacitor region is formed thereon. A trench(65) for exposing the lower electrode to the outside is formed in the first interlayer dielectric by using the first photoresist pattern as an etching mask. A dielectric film(68) and an upper electrode(70) are completely filled in the trench.
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申请公布号 |
KR20050005972(A) |
申请公布日期 |
2005.01.15 |
申请号 |
KR20030045970 |
申请日期 |
2003.07.08 |
申请人 |
MAGNACHIP SEMICONDUCTOR, LTD. |
发明人 |
HAN, SEUNG HEE |
分类号 |
H01L21/3205;(IPC1-7):H01L21/320 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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