发明名称 SEMICONDUCTOR DEVICE FOR PREVENTING CHANNEL STOP IMPLANTATION LAYER FROM BEING FORMED IN ACTIVE REGION
摘要 PURPOSE: A semiconductor device is provided to improve deterioration in a transistor characteristic by preventing a channel stop implantation layer from being formed in an active region. CONSTITUTION: A semiconductor device includes a MOS transistor on an SOI layer of an SOI substrate. The SOI substrate is formed by sequentially stacking a semiconductor substrate(1), a buried insulating layer(2), and the SOI layer(3). The semiconductor device includes a random logic part and an SRAM part. The random logic part is electrically isolated by a partial separative oxide layer having the SOI layer. The SRAM part is electrically isolated by a complete separative oxide layer approaching the buried insulating layer through the SOI layer. The random logic part is formed on the SOI layer and includes a body region potential-fixable from the outside. The body region is in contact with the SOI layer under the partial separative oxide layer.
申请公布号 KR20050006107(A) 申请公布日期 2005.01.15
申请号 KR20040109822 申请日期 2004.12.21
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 HIRANO, YUUICHI;IWAMATSU, TOSHIAKI;MAEDA, SHIGENOBU;MAEGAWA, SHIGETO;MATSUMOTO, TAKUJI;TSUJIUCHI, MIKIO
分类号 H01L21/66;H01L21/336;H01L21/76;H01L21/762;H01L21/8238;H01L21/8244;H01L21/84;H01L27/08;H01L27/092;H01L27/10;H01L27/11;H01L27/12;H01L29/786;(IPC1-7):H01L21/762 主分类号 H01L21/66
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