发明名称 METHOD OF FORMING TUNGSTEN PLUG OF SEMICONDUCTOR DEVICE USING SELECTIVE TUNGSTEN DEPOSITION AND BLANKET TUNGSTEN DEPOSITION TOGETHER
摘要 PURPOSE: A method of forming a tungsten plug of a semiconductor device is provided to acquire good burial properties and to form uniform tungsten plugs regardless of the difference of depth between contact holes by using a selective tungsten deposition and a blanket tungsten deposition together. CONSTITUTION: A semiconductor substrate(1) with a conductive pattern(2) is provided. An insulating layer(3) with a first contact hole(4) for exposing the conductive pattern and a second contact hole(4a) for exposing selectively the substrate is formed thereon. A first and second tungsten plugs(5,5a) are partially filled in the first and second contact holes by using a selective tungsten deposition. An adhesive layer(6) is formed along the entire surface of the resultant structure. A tungsten film is formed on the adhesive layer by using a blanket tungsten deposition. A third and fourth tungsten plug(7a,7b) are completely filled in the first and second contact holes by performing CMP(Chemical Mechanical Polishing) on the tungsten film.
申请公布号 KR20050005957(A) 申请公布日期 2005.01.15
申请号 KR20030045952 申请日期 2003.07.08
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 JEONG, JONG YEUL
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址