发明名称 COLUMN DECODER CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE, ESPECIALLY REDUCING CHIP SIZE BY USING FOUR NOR GATES
摘要 PURPOSE: A column decoder circuit of a semiconductor memory device is provided to reduce the chip size and to reduce the processing speed delay in a read/write mode through using four NOR gates. CONSTITUTION: A column decoder circuit of a semiconductor memory device comprises plural NMOS transistors(60-90); plural gate circuits(301-30n) for generating a switching control signal for selecting a bit line of a column group after logic combining between a decoding signal(YA) from the global column decoder for selecting a bit line and a decoding signal(YB) from the global column decoder for selecting a column group; plural bit line selectors(401-40n) for connecting the corresponding bit line to the corresponding data line according to the switching control signal from the gate circuits. Wherein the plural gate circuits consist of four NOR gates(50, 52, 54, 56).
申请公布号 KR20050005575(A) 申请公布日期 2005.01.14
申请号 KR20030045512 申请日期 2003.07.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, BYUNG GIL;KWAK, CHOONG KEUN
分类号 G11C8/10;G11C11/00;(IPC1-7):G11C8/10 主分类号 G11C8/10
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