发明名称 Semiconductor device and method of manufacturing the same
摘要 There is disclosed is a semiconductor device which comprises a semiconductor substrate, isolation regions formed within the semiconductor substrate to define the active region, a pair of impurity diffusion regions formed within the element region in a manner to have surfaces elevated from the isolation region, a SiGe film formed on an upper surface of the impurity diffusion region so as to cover partly the side surface of the impurity diffusion region, a Ge concentration in the SiGe film being higher at a lower surface of the SiGe film than at an upper surface of the SiGe film, a metal silicide layer formed on the SiGe film, and a gate electrode formed in the active region of the semiconductor substrate with a gate insulating film interposed therebetween and having a sidewall insulating film formed on the side surface.
申请公布号 US2005006637(A1) 申请公布日期 2005.01.13
申请号 US20030743006 申请日期 2003.12.23
申请人 IINUMA TOSHIHIKO;MIZUSHIMA ICHIRO;IZUHA MITSUAKI;MIYANO KIYOTAKA;SUGURO KYOICHI 发明人 IINUMA TOSHIHIKO;MIZUSHIMA ICHIRO;IZUHA MITSUAKI;MIYANO KIYOTAKA;SUGURO KYOICHI
分类号 H01L21/28;H01L21/336;H01L29/165;H01L29/417;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L29/06 主分类号 H01L21/28
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