发明名称 Methods of forming a multilayer stack alloy for work function engineering
摘要 A method of forming a gate electrode is described, comprising forming a dielectric layer on a substrate, forming a first metal layer having a first work function on the dielectric layer, forming a second metal layer having a second work function on the first metal layer, such that a gate electrode is formed on the dielectric layer which has a work function that is determined from the work function of the alloy of the two types of metal. The work function of a microelectronic transistor can be varied or "tuned" depending on the precise definition and control of the metal types, layer sequence, individual layer thickness and total number of layers.
申请公布号 US2005009311(A1) 申请公布日期 2005.01.13
申请号 US20040916191 申请日期 2004.08.09
申请人 BARNAK JOHN;BORLA COLLIN;DOCZY MARK;KUHN MARKUS;JENSEN JACOB M. 发明人 BARNAK JOHN;BORLA COLLIN;DOCZY MARK;KUHN MARKUS;JENSEN JACOB M.
分类号 H01L21/28;H01L29/49;(IPC1-7):H01L21/823 主分类号 H01L21/28
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