发明名称 |
Manufacturing method of semiconductor device |
摘要 |
The invention provides an algorithm for aligning a rotating blade in a dicing process of partially dicing a wafer attached to a substrate. A width of a cut groove and distance between pads in the cut groove are detected by a recognition camera. Based on a result of this detection, alignment data Deltay which is distance between a centerline of the width of the cut groove and a real centerline are calculated. Based on a difference between the distance of the pads in the cut groove and a target value of the distance, data Deltaz on alignment in a depth direction of the cut groove is calculated. The rotating blade is aligned by using the alignment data Deltay and Deltaz.
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申请公布号 |
US2005009302(A1) |
申请公布日期 |
2005.01.13 |
申请号 |
US20040771497 |
申请日期 |
2004.02.05 |
申请人 |
SANYO ELECTRIC CO., LTD. |
发明人 |
WAKUI MOTOAKI;OCHIAI ISAO;EYAL RON;SHETRIT GIL |
分类号 |
H01L21/301;H01L21/44;H01L21/46;H01L21/66;H01L21/78;(IPC1-7):H01L21/301 |
主分类号 |
H01L21/301 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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