发明名称 Manufacturing method of semiconductor device
摘要 The invention provides an algorithm for aligning a rotating blade in a dicing process of partially dicing a wafer attached to a substrate. A width of a cut groove and distance between pads in the cut groove are detected by a recognition camera. Based on a result of this detection, alignment data Deltay which is distance between a centerline of the width of the cut groove and a real centerline are calculated. Based on a difference between the distance of the pads in the cut groove and a target value of the distance, data Deltaz on alignment in a depth direction of the cut groove is calculated. The rotating blade is aligned by using the alignment data Deltay and Deltaz.
申请公布号 US2005009302(A1) 申请公布日期 2005.01.13
申请号 US20040771497 申请日期 2004.02.05
申请人 SANYO ELECTRIC CO., LTD. 发明人 WAKUI MOTOAKI;OCHIAI ISAO;EYAL RON;SHETRIT GIL
分类号 H01L21/301;H01L21/44;H01L21/46;H01L21/66;H01L21/78;(IPC1-7):H01L21/301 主分类号 H01L21/301
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