发明名称 Plasma CVD method
摘要 In a process of forming a silicon oxide film 116 that constitutes an interlayer insulating film with TEOS as a raw material through the plasma CVD method, the RF output is oscillated at 50 W, and the RF output is gradually increased from 50 W to 250 W (an output value at the time of forming a film) after discharging (after the generation of O2-plasma). A TEOS gas is supplied to start the film formation simultaneously when the RF output becomes 250 W, or while the timing is shifted. As a result, because the RF power supply is oscillated at a low output when starting discharging, a voltage between the RF electrodes can be prevented from changing transitionally and largely.
申请公布号 US2005009309(A1) 申请公布日期 2005.01.13
申请号 US20040911710 申请日期 2004.08.05
申请人 发明人 YAMAZAKI SHUNPEI;SAKAMA MITSUNORI;HIROKI MASAAKI
分类号 C23C16/40;C23C16/505;H01L21/316;(IPC1-7):H01L21/00;H01L21/84;C30B1/00;H01L21/31 主分类号 C23C16/40
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