发明名称 AUTOMATIC TEST SYSTEM WITH EASILY MODIFIED SOFTWARE
摘要 <p>An automatic test system, such as might be used to test semiconductor devices as part of their manufacture. The test system uses instruments to generate and measure test signals. The automatic test system has a hardware and software architecture that allows instruments to be added to the test system after it is manufactures. The software is segregated into instrument specific and instrument independent software. Predefined interfaces to the software components allow for easy integration of instruments into the test system and also easy reuse of the software as the physical implementation of the test system or the instruments changes form tester to tester in a product family.</p>
申请公布号 WO2005003798(A1) 申请公布日期 2005.01.13
申请号 WO2004US18664 申请日期 2004.06.12
申请人 TERADYNE, INC. 发明人 HLOTYAK, STEPHEN, J.;BLITZ, ALAN, L.;STIMSON, RANDAL, B.
分类号 G01R31/3183;G01R31/319;G06F9/44;G06F19/00;H04L1/22;(IPC1-7):G01R31/319;G01R31/318 主分类号 G01R31/3183
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