| 摘要 |
<p>A method for correcting the sensitivity of a read-out device for X-ray storage fluorescent layers involves (a) initially radiating an incidence surface of the storage device with a specified homogenous X-ray intensity followed by (b) sequentially irradiating the incidence surface with a specified homogenous light-intensity. The emitted light is then measured (c) for each pixel HBi,j of a matrix describing the incidence surface and the steps (a-c) are multiply repeated to ascertain an average signal value for each pixel, followed by correcting for pixel PBi,j of intensities measured for a raw image by using average signal value ascertained for the corresponding pixel Ebi,j. An independent claim is included for a read-out device for X-ray storage fluorescent layers.</p> |
