发明名称 Complementary division mask, method of producing mask, and program
摘要 A complementary division method able to suppress a pattern deformation by wet washing, having the steps of determining a definite division length able to suppress the pattern deformation when wet washing to a width and distance of a pattern that is assumed the pattern deformation over an elasticity limit is easiest given by wet washing in advance, dividing the entire line-and-space patterns at the determined division length in the longitudinal direction to divide suitably the line-and-space pattern by a simple algorithm, and further providing a method of producing a mask and program.
申请公布号 US2005008948(A1) 申请公布日期 2005.01.13
申请号 US20040885822 申请日期 2004.07.07
申请人 WATANABE YOKO;OMORI SHINJI 发明人 WATANABE YOKO;OMORI SHINJI
分类号 B08B3/04;G03F1/14;G03F1/16;G03F1/20;G03F1/68;G03F9/00;G06F17/50;H01L21/027;(IPC1-7):G03F9/00 主分类号 B08B3/04
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