发明名称 |
Spatial and temporal selective laser assisted fault localization |
摘要 |
A method and apparatus for laser-assisted fault mapping which synchronizes the laser control with the tester unit. The inventive method provides for laser-assisted pseudo-static fault mapping to localize defects in a device whose inputs are being stimulated dynamically by a tester. It further provides for laser-assisted dynamic soft error mapping, to localize in terms of location and to correlate with respect to a specific test vector, sensitive areas in a device by utilizing device performance criteria such as pass-fail status outputs. The apparatus includes a fully controllable dynamic laser stimulation apparatus connected to a control unit that provides complete synchronization with a tester unit.
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申请公布号 |
US2005006602(A1) |
申请公布日期 |
2005.01.13 |
申请号 |
US20040888840 |
申请日期 |
2004.07.09 |
申请人 |
PERDU PHILIPPE;DESPLATS ROMAIN;BEAUDOIN FELIX;VEDAGARBHA PRAVEEN;LEIBOWITZ MARTIN;WILSHER KENNETH R. |
发明人 |
PERDU PHILIPPE;DESPLATS ROMAIN;BEAUDOIN FELIX;VEDAGARBHA PRAVEEN;LEIBOWITZ MARTIN;WILSHER KENNETH R. |
分类号 |
G01R31/26;G01R31/302;G01R31/311;G03C5/00;G06F17/50;G21K5/10;H01J37/08;H01S;(IPC1-7):H01J37/08 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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