发明名称 SPECTROMETRIC PROCESS MONITORING
摘要 <p>Spectrometric apparatus that include an array of detector elements and exhibits a number of capabilities is disclosed. The elements can be responsive to incident radiation to produce an output signal that includes information from the incident radiation. A spectrally selective element can be located in an optical path between the radiation source and the array, with an analysis module responsive to the output signal operative to analyze spatial distribution of spectral information received by the array. The apparatus can also correct for differences in intensity and spectral variability for spectral image signals and/or compare the spectral image signals with a pattern in spatial-spectral coordinate space. Detector elements can be responsive to scattering, and spatial information in their output can be analyzed.</p>
申请公布号 EP1495292(A1) 申请公布日期 2005.01.12
申请号 EP20020797486 申请日期 2002.12.23
申请人 MALVERN INSTRUMENTS INCORPORATED 发明人 LEWIS, E., NEIL;HABER, KENNETH, S.
分类号 G01J3/28;G01J3/02;G01J3/26;G01J3/42;G01J3/51;G01N21/31;G01N21/65;(IPC1-7):G01J3/28 主分类号 G01J3/28
代理机构 代理人
主权项
地址
您可能感兴趣的专利