发明名称 METHOD OF FABRICATING FLASH DEVICE TO FORM UNIFORM GATE ELECTRODE PATTERN AND PREVENT DAMAGE OF TOP PART OF CONTROL GATE ELECTRODE
摘要 PURPOSE: A method of fabricating a flash device is provided to form a uniform gate electrode pattern by patterning a gate electrode by a hard mask layer having different material layers. CONSTITUTION: A tunnel oxide layer and a floating gate pattern are formed on a semiconductor substrate(110). A dielectric layer(114), a first conductive layer, and a metal layer(118) are sequentially formed on the entire surface of the semiconductor substrate. A hard mask layer(150) including different material layers is formed on the metal layer. The hard mask layer is patterned by using a gate mask. A gate electrode of a flash device is formed by etching sequentially the metal layer, the first conductive layer, the dielectric layer, and the floating gate pattern.
申请公布号 KR20050003537(A) 申请公布日期 2005.01.12
申请号 KR20030042432 申请日期 2003.06.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, JUNG WOONG
分类号 H01L21/8247;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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