发明名称 Antifuse structure and a method of forming an antifuse structure
摘要 The present invention comprises an antifuse having a hemispherical grained (HSG) layer and a method of forming antifuse having a hemispherical grained (HSG) layer. The antifuse of the present invention comprises a plurality of layers, the first being a lower electrode that is disposed on an impurity region in a semiconductor substrate. A dielectric layer is disposed on the lower electrode, wherein the dielectric layer has a planar surface. A non-conductive hemispherical grain (HSG) layer is formed on the planar surface of the dielectric layer and an upper electrode is disposed on said non-conductive hemispherical grain (HSG) layer forming the antifuse.
申请公布号 US6841846(B1) 申请公布日期 2005.01.11
申请号 US20030625491 申请日期 2003.07.22
申请人 ACTEL CORPORATION 发明人 CHEN HUNG-SHENG;TSENG HUAN-CHUNG;HUANG CHANG-KAI
分类号 H01L23/525;(IPC1-7):H01L29/00 主分类号 H01L23/525
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