发明名称 TRANSISTOR FABRICATION METHOD FOR CONTROLLING THRESHOLD VOLTAGE AND INCREASING RETENTION TIME USING SELECTIVE ION IMPLANTATION PROCESS
摘要 PURPOSE: A method of fabricating a transistor is provided to control a threshold voltage and increase a retention time by implanting selectively ions only into a channel region of a lower part of a gate. CONSTITUTION: A field oxide layer(220) is formed on a semiconductor substrate(200) to define an active region and a field region and a well implantation process and a field implantation process are performed. A gate is patterned and only a cell region is opened. Ions are implanted only into a channel region of a lower part of the gate by forming a tilt on the cell region and performing a bimode type ion implantation process. A source/drain is formed thereon.
申请公布号 KR20050003288(A) 申请公布日期 2005.01.10
申请号 KR20030044008 申请日期 2003.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHOI, KANG SIK
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
代理机构 代理人
主权项
地址