发明名称 |
TRANSISTOR FABRICATION METHOD FOR CONTROLLING THRESHOLD VOLTAGE AND INCREASING RETENTION TIME USING SELECTIVE ION IMPLANTATION PROCESS |
摘要 |
PURPOSE: A method of fabricating a transistor is provided to control a threshold voltage and increase a retention time by implanting selectively ions only into a channel region of a lower part of a gate. CONSTITUTION: A field oxide layer(220) is formed on a semiconductor substrate(200) to define an active region and a field region and a well implantation process and a field implantation process are performed. A gate is patterned and only a cell region is opened. Ions are implanted only into a channel region of a lower part of the gate by forming a tilt on the cell region and performing a bimode type ion implantation process. A source/drain is formed thereon.
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申请公布号 |
KR20050003288(A) |
申请公布日期 |
2005.01.10 |
申请号 |
KR20030044008 |
申请日期 |
2003.06.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHOI, KANG SIK |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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