发明名称 |
ACTIVE TERMINATION RESISTORS OF MEMORY SYSTEM AND ADJUSTING METHOD, ESPECIALLY CONTROLLING TO TURN ON/OFF TERMINATION RESISTOR REGARDLESS OF AN OPERATION MODE OF DRAM |
摘要 |
PURPOSE: Active termination resistors of a memory system and an adjusting method thereof are provided to perform on/off control of the active termination resistors of DRAM regardless of an operation mode of DRAM mounted on a memory module. CONSTITUTION: Active termination resistors in a memory circuit for terminating the memory circuit comprises node; plural first termination resistors connected with a source voltage and the node in response to a corresponding control signal; plural second termination resistors connected with the source voltage and the node in response to a corresponding control signal. the adjusting method of the active termination resistors comprises the steps of: measuring one of the first termination resistors connected with the source voltage and the node in response to the corresponding control signal; adjusting the number of the first termination resistors connected with the node and the source voltage in response to the corresponding control signal by using the measured resistance.
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申请公布号 |
KR20050002705(A) |
申请公布日期 |
2005.01.10 |
申请号 |
KR20040095895 |
申请日期 |
2004.11.22 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KYUNG, KYE HYUN |
分类号 |
G11C7/10;G11C11/40;G11C11/407;G11C11/4093;(IPC1-7):G11C11/407 |
主分类号 |
G11C7/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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