发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR MEMORY DEVICE CAPABLE OF IMPROVING CAPACITANCE USING SILICA FILM WITH MICRO PORE
摘要 PURPOSE: A method for manufacturing a semiconductor memory device is provided to improve capacitance by forming a lower electrode using a silica film having micro pore. CONSTITUTION: An interlayer dielectric(130) having a contact plug(140) is formed on a substrate(100). An etch stopper(150) is formed on the resultant structure. A silica film(160) with a plurality of micro pores(165) is formed on the etch stopper. A lower electrode region(170) is formed to expose the contact plug by etching the silica film and the etch stopper. A lower electrode is then formed on the lower electrode region.
申请公布号 KR20050002982(A) 申请公布日期 2005.01.10
申请号 KR20030043028 申请日期 2003.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 ROH, JAE SUNG
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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