发明名称 METHOD FOR FABRICATING EXPOSURE MASK FOR PHOTOLITHOGRAPHY WITH SILYLATION LAYER
摘要 PURPOSE: A method for fabricating an exposure mask for a photolithography is provided to obtain easily a micro pattern by silylation processing. CONSTITUTION: A shielding layer(12) and a resist layer(14) are sequentially formed on a transparent substrate(10). An exposure region is formed by exposing selectively the resist layer. A silylation layer(18) is formed in the region of exposure by silylation processing at the region of exposure. The shielding layer is patterned by using a resist pattern as an etching mask. The resist layer pattern is removed from the shielding layer pattern.
申请公布号 KR20050001750(A) 申请公布日期 2005.01.07
申请号 KR20030042036 申请日期 2003.06.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, YOUNG SIK
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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