发明名称 |
METHOD FOR FABRICATING EXPOSURE MASK FOR PHOTOLITHOGRAPHY WITH SILYLATION LAYER |
摘要 |
PURPOSE: A method for fabricating an exposure mask for a photolithography is provided to obtain easily a micro pattern by silylation processing. CONSTITUTION: A shielding layer(12) and a resist layer(14) are sequentially formed on a transparent substrate(10). An exposure region is formed by exposing selectively the resist layer. A silylation layer(18) is formed in the region of exposure by silylation processing at the region of exposure. The shielding layer is patterned by using a resist pattern as an etching mask. The resist layer pattern is removed from the shielding layer pattern.
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申请公布号 |
KR20050001750(A) |
申请公布日期 |
2005.01.07 |
申请号 |
KR20030042036 |
申请日期 |
2003.06.26 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, YOUNG SIK |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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