发明名称 METHOD FOR FABRICATING CAPACITOR OF SEMICONDUCTOR DEVICE TO IMPROVE CONTACT CHARACTERISTIC AND EMBODY PROCESS SIMPLIFICATION AND COST REDUCTION
摘要 PURPOSE: A method for fabricating a capacitor of a semiconductor device is provided to improve a contact characteristic and embody process simplification and cost reduction by sufficiently guaranteeing a contact area between a storage node contact plug and a lower electrode. CONSTITUTION: A semiconductor substrate(40) is prepared which has a storage node contact plug(45) isolated by an interlayer dielectric. An insulation layer for forming a lower electrode is deposited on the substrate. A circular hole for the lower electrode is formed to expose a part of the storage node contact plug. The contact plug exposed to the inside of the hole is partially eliminated. A material layer for the lower electrode is deposited to fill a portion from which the contact plug is removed.
申请公布号 KR20050002026(A) 申请公布日期 2005.01.07
申请号 KR20030043072 申请日期 2003.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, NAM JAE;PARK, KYE SOON
分类号 H01L27/108;H01L21/02;H01L21/768;H01L21/8242;(IPC1-7):H01L27/108 主分类号 H01L27/108
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