发明名称 |
METHOD FOR FABRICATING CAPACITOR OF SEMICONDUCTOR DEVICE TO IMPROVE CONTACT CHARACTERISTIC AND EMBODY PROCESS SIMPLIFICATION AND COST REDUCTION |
摘要 |
PURPOSE: A method for fabricating a capacitor of a semiconductor device is provided to improve a contact characteristic and embody process simplification and cost reduction by sufficiently guaranteeing a contact area between a storage node contact plug and a lower electrode. CONSTITUTION: A semiconductor substrate(40) is prepared which has a storage node contact plug(45) isolated by an interlayer dielectric. An insulation layer for forming a lower electrode is deposited on the substrate. A circular hole for the lower electrode is formed to expose a part of the storage node contact plug. The contact plug exposed to the inside of the hole is partially eliminated. A material layer for the lower electrode is deposited to fill a portion from which the contact plug is removed.
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申请公布号 |
KR20050002026(A) |
申请公布日期 |
2005.01.07 |
申请号 |
KR20030043072 |
申请日期 |
2003.06.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, NAM JAE;PARK, KYE SOON |
分类号 |
H01L27/108;H01L21/02;H01L21/768;H01L21/8242;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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