发明名称 METHOD OF MANUFACTURING SUBSTRATE
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method, a polishing method and a scratch reducing method for a substrate which notably reduce nano-scratches and wide scratches with very wide width of 10-50 &mu;m and shallow depth of 5 nm or less, and moreover allow efficient polishing. <P>SOLUTION: The substrate manufacturing method uses a polishing fluid composition containing abrasives, an oxidizer, acid and/or its salt, and water, and a polishing pad having a surface member with an average pore diameter of 0.01-35 &mu;m. The substrate polishing method uses: the polishing fluid composition containing the abrasives, oxidizer, acid and/or its salt, and water; and the polishing pad having the surface member with the average pore diameter of 0.01-35 &mu;m. The scratch reducing method uses the polishing fluid composition containing the abrasives, oxidizer, acid and/or its salt, and water, and the polishing pad having the surface member with the average pore diameter of 0.01-35 &mu;m. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005001018(A) 申请公布日期 2005.01.06
申请号 JP20030164322 申请日期 2003.06.09
申请人 KAO CORP 发明人 OOSHIMA YOSHIAKI;HAGIWARA TOSHIYA
分类号 B24B57/02;B24B1/00;B24B37/00;B24B37/20;B24B37/22;B24B37/24;C09K3/14;G11B5/84;H01L21/304 主分类号 B24B57/02
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