发明名称 METHOD AND DEVICE FOR MEASURING PHOTOELECTRIC TRANSFER CHARACTERISTIC OF SOLAR CELL ELEMENT
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method and device for measuring a photoelectric transfer characteristic of a solar cell element, wherein a stable contact not affected by a probe and a probe driving mechanism with respect to a light irradiated on a light receiving surface is materialized, so that a measuring accuracy of the photoelectric transfer characteristic of the solar cell element can be enhanced. <P>SOLUTION: The method has the steps of: setting the light receiving surface of the solar cell element as an upper surface so that the solar cell element 1 is mounted and fixed to a stage 6; irradiating a light from the upper surface on a photoelectric transfer layer of the solar cell element; and bringing a first electrode 5 and a projected electrode 401 of a second electrode into contact with probes 802, 801 provided on an opposed side of the light receiving surface, respectively. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005005639(A) 申请公布日期 2005.01.06
申请号 JP20030170419 申请日期 2003.06.16
申请人 CANON INC 发明人 HAGA SHUNICHI;MATSUYAMA FUKATERU;NIIKURA SATOSHI
分类号 G01R31/26;G01R31/36;H01L31/00;H01L31/04;H01L35/00;H01L37/00;(IPC1-7):H01L31/04 主分类号 G01R31/26
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