发明名称 |
CARBON BLACK FOR SEMICONDUCTOR ENCAPSULATION MATERIAL |
摘要 |
PROBLEM TO BE SOLVED: To provide a carbon black for a semiconductor encapsulation material capable of preventing current leakage failure even in a semiconductor device having extremely small distance of gold wires. SOLUTION: The carbon black for a semiconductor encapsulation material is produced by coating a carbon black having a volatile content of≥5 wt.% with a resin and has a THF-soluble content of≤60 wt.% based on the coating resin. The carbon black and non-insulating coarse particles included in the carbon back are firmly covered with the insulation resin. Even if the non-insulating coarse particle in the carbon black or the coagulated carbon black is brought into contact with the gold wire of a semiconductor device having extremely small gold wire distance in a state placed close to the wire or connecting the wires, electric current is not passed through the particle, etc. Accordingly, the leakage failure caused by the non-insulating coarse particle or the coagulated carbon black is suppressed by the use of the carbon black. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005002272(A) |
申请公布日期 |
2005.01.06 |
申请号 |
JP20030169518 |
申请日期 |
2003.06.13 |
申请人 |
MITSUBISHI CHEMICALS CORP |
发明人 |
FURUKI NOBORU;ASABA OSAMU;SEKINE YUICHI |
分类号 |
C09K3/10;C09C1/56;C09C3/10;(IPC1-7):C09C1/56 |
主分类号 |
C09K3/10 |
代理机构 |
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