发明名称 Lithographic apparatus and method of a manufacturing device
摘要 A lithographic projection apparatus having a radiation system for providing a projection beam of radiation; a support structure for supporting a patterning device, the patterning device serving to pattern the projection beam according to a desired pattern; a substrate holder for holding a substrate the substrate holder provided with a device to provide a holding force for pressing the substrate against the substrate holder; a releasing structure constructed and arranged to eject the substrate from the holder against the holding force; and a projection system for projecting the patterned beam onto a target portion of the substrate. The lithographic projection apparatus may include a controller for controlling the releasing structure so as to release the substrate from the holder with a release force that is reduced prior to final release.
申请公布号 US2005002010(A1) 申请公布日期 2005.01.06
申请号 US20040840797 申请日期 2004.05.07
申请人 ASML NETHERLANDS B.V. 发明人 ZAAL KOEN JACOBUS JOHANNES MARIA;VAN EMPEL TJARKO ADRIAAN RUDOLF;VAN MEER ASCHWIN LODEWIJK HENDRICUS JOHANNES;MIEDEMA JAN REIN;OTTENS JOOST JEROEN
分类号 H01L21/683;G03F7/20;H01L21/027;(IPC1-7):G03B27/58 主分类号 H01L21/683
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