发明名称 PHOTOMASK FOR FABRICATING SEMICONDUCTOR DEVICE TO ELIMINATE CHEMICAL RESIDUE IN PELLICLE
摘要 PURPOSE: A photomask for fabricating a semiconductor device is provided to eliminate the chemical residue in a pellicle by injecting inert gas to the inside of the pellicle while the inert gas is exhausted by a predetermined flowrate. CONSTITUTION: A pellicle film(23) is formed on a mask glass(21) for pattern transcription. A pellicle frame(22) supports the pellicle film. A flow hole(27) is formed at one side of the pellicle frame so that inert gas is injected to the inside of the pellicle. A vent hole(26) is formed at the other side of the pellicle frame to exhaust the chemical residue by the inert gas.
申请公布号 KR20050001093(A) 申请公布日期 2005.01.06
申请号 KR20030042656 申请日期 2003.06.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, JUN SIK
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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