发明名称 |
PHOTOMASK FOR FABRICATING SEMICONDUCTOR DEVICE TO ELIMINATE CHEMICAL RESIDUE IN PELLICLE |
摘要 |
PURPOSE: A photomask for fabricating a semiconductor device is provided to eliminate the chemical residue in a pellicle by injecting inert gas to the inside of the pellicle while the inert gas is exhausted by a predetermined flowrate. CONSTITUTION: A pellicle film(23) is formed on a mask glass(21) for pattern transcription. A pellicle frame(22) supports the pellicle film. A flow hole(27) is formed at one side of the pellicle frame so that inert gas is injected to the inside of the pellicle. A vent hole(26) is formed at the other side of the pellicle frame to exhaust the chemical residue by the inert gas.
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申请公布号 |
KR20050001093(A) |
申请公布日期 |
2005.01.06 |
申请号 |
KR20030042656 |
申请日期 |
2003.06.27 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, JUN SIK |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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